Scanning Transmission Electron Microscopy and Diffraction...

Microscopy and Microanalysis 2019 / 02 Vol. 25; Iss. S1

Scanning Transmission Electron Microscopy and Diffraction in SEM: Novel Approaches for In Situ Studies

Spiecker, Erdmann, Dolle, Christian, Schweizer, Peter, Denninger, Peter
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Volume:
25
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927618015866
Date:
February, 2019
File:
PDF, 575 KB
2019
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