Empirical and Theoretical Modeling of Low-Frequency Noise Behavior of Ultrathin Silicon-on-Insulator MOSFETs Aiming at Low-Voltage and Low-Energy Regime
Omura, YasuhisaVolume:
10
Journal:
Micromachines
DOI:
10.3390/mi10010005
Date:
December, 2018
File:
PDF, 3.40 MB
2018