Reflection phase microscopy by successive accumulation of...

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ACS Photonics 2019 / 02

Reflection phase microscopy by successive accumulation of interferograms

Hyeon, Min Gyu, Yang, Taeseok Daniel, Park, Jin-Sung, Park, Kwanjun, Kang, Yong Guk, Kim, BeopMin, Choi, Youngwoon
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Journal:
ACS Photonics
DOI:
10.1021/acsphotonics.8b01703
Date:
February, 2019
File:
PDF, 846 KB
2019
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