[IEEE 2018 17th IEEE International Conference on Machine Learning and Applications (ICMLA) - Orlando, FL, USA (2018.12.17-2018.12.20)] 2018 17th IEEE International Conference on Machine Learning and Applications (ICMLA) - Deep Bayesian Active Semi-Supervised Learning
Matthias, Rottmann, Karsten, Kahl, Hanno, GottschalkYear:
2018
Language:
english
DOI:
10.1109/ICMLA.2018.00031
File:
PDF, 552 KB
english, 2018