![](/img/cover-not-exists.png)
[IEEE 2018 IEEE/WIC/ACM International Conference on Web Intelligence (WI) - Santiago, Chile (2018.12.3-2018.12.6)] 2018 IEEE/WIC/ACM International Conference on Web Intelligence (WI) - A Plagiarism Detection Engine for Images in Docode
Sepulveda, Simon, Pizarro V., Gaspar, Velasquez, Juan D.Year:
2018
Language:
english
DOI:
10.1109/WI.2018.00-78
File:
PDF, 428 KB
english, 2018