Fabrication of Standard Calibration Samples for Highly Reliable Atomic Force Microscope Measurements
Park, Tae Hoon, Park, Ju Hyun, Jeon, Dong Su, Kim, Yong Kyun, Min, Chi Hong, Yu, Jae Heung, Kim, Tae GeunVolume:
17
Language:
english
Journal:
Journal of Nanoscience and Nanotechnology
DOI:
10.1166/jnn.2017.14842
Date:
October, 2017
File:
PDF, 9.84 MB
english, 2017