Using light, X-rays and electrons for evaluation of the...

Nanoscale 2018 Vol. 10; Iss. 45

Using light, X-rays and electrons for evaluation of the nanostructure of layered materials

Djamil, John, Hansen, Anna-Lena, Backes, Claudia, Bensch, Wolfgang, Schürmann, Ulrich, Kienle, Lorenz, Düvel, Andre, Heitjans, Paul
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Volume:
10
Year:
2018
Language:
english
Journal:
Nanoscale
DOI:
10.1039/c8nr07287f
File:
PDF, 2.58 MB
english, 2018
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