Local electrical characterization of two-dimensional materials with functional atomic force microscopy
Hussain, Sabir, Xu, Kunqi, Ye, Shili, Lei, Le, Liu, Xinmeng, Xu, Rui, Xie, Liming, Cheng, ZhihaiVolume:
14
Language:
english
Journal:
Frontiers of Physics
DOI:
10.1007/s11467-018-0879-7
Date:
June, 2019
File:
PDF, 10.95 MB
english, 2019