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Optics of the NIFS negative ion source test stand by infrared calorimetry and numerical modelling
Veltri, P., Antoni, V., Agostinetti, P., Brombin, M., Ikeda, K., Kisaki, M., Nakano, H., Sartori, E., Serianni, G., Takeiri, Y., Tsumori, K.Volume:
87
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.4932982
Date:
February, 2016
File:
PDF, 3.30 MB
english, 2016