[IEEE 2018 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) - Hangzhou (2018.8.13-2018.8.17)] 2018 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) - Enhancing Performance in Thin Tilm Transistors with Vacuum or Solution Processed Amorphous Oxide Semiconductors Towards Display Applications
Chen, Changdong, Li, Gongtan, Li, MinMin, Yang, Bo-Ru, Liu, Chuan, Lee, Chia-Yu, Wu, Yuan-Chun, Lu, Po-Yen, Shieh, Han-Ping D.Year:
2018
DOI:
10.1109/3M-NANO.2018.8552192
File:
PDF, 7 KB
2018