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[IEEE 2018 XIV International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk (2018.10.2-2018.10.6)] 2018 XIV International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - A Review of the Properties of Some Tests for Exponentiality
Blinov, Pavel Yu., Lemeshko, Boris Yu.Year:
2018
DOI:
10.1109/APEIE.2018.8546128
File:
PDF, 8 KB
2018