[IEEE 2018 24th International Conference on Pattern Recognition (ICPR) - Beijing (2018.8.20-2018.8.24)] 2018 24th International Conference on Pattern Recognition (ICPR) - Robust Locality-Constrained Label Consistent K-SVD by Joint Sparse Embedding
Zhang, Zhao, Jiang, Weiming, Li, Sheng, Qin, Jie, Liu, Guangcan, Yan, ShuichengYear:
2018
Language:
english
DOI:
10.1109/icpr.2018.8545446
File:
PDF, 781 KB
english, 2018