[ASME ASME 2011 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference - Washington, DC, USA (August 28–31, 2011)] Volume 3: 2011 ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications, Parts A and B - FR4 Electromagnetic Scanner Based Fourier Transform Spectrometer
Baran, Utku, Hedili, Kivanc, Olcer, Selim, Urey, HakanYear:
2011
Language:
english
DOI:
10.1115/DETC2011-48161
File:
PDF, 506 KB
english, 2011