[IEEE 2018 5th International Conference on Information Science and Control Engineering (ICISCE) - Zhengzhou, China (2018.7.20-2018.7.22)] 2018 5th International Conference on Information Science and Control Engineering (ICISCE) - Pulse Eddy Current Testing Thin Metal Thickness
Wang, Zhi-chun, Lu, Jun-wei, Hu, Qing-nanYear:
2018
DOI:
10.1109/ICISCE.2018.00241
File:
PDF, 6 KB
2018