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IEEE Transactions on Circuits and Systems II: Express Briefs 2019

GC-eDRAM with Body-Bias Compensated Readout and Error Detection in 28nm FD-SOI

Giterman, Robert, Bonetti, Andrea, Burg, Andreas, Teman, Adam
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Year:
2019
Language:
english
Journal:
IEEE Transactions on Circuits and Systems II: Express Briefs
DOI:
10.1109/TCSII.2019.2896164
File:
PDF, 6 KB
english, 2019
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