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Journal of Electronic Testing 2019 / 2

Fault Tolerant Soft-Core Processor Architecture Based on Temporal Redundancy

Villa, Paulo R. C., Travessini, Rodrigo, Goerl, Roger C., Vargas, Fabian L., Bezerra, Eduardo A.
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Language:
english
Journal:
Journal of Electronic Testing
DOI:
10.1007/s10836-019-05778-z
Date:
February, 2019
File:
PDF, 2.38 MB
english, 2019
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