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Implications of Ageing through Power Cycling on the Short Circuit Robustness of 1.2-kV SiC MOSFETs
Diaz Reigosa, Paula, Luo, Haoze, Iannuzzo Ge, FrancescoYear:
2019
Language:
english
Journal:
IEEE Transactions on Power Electronics
DOI:
10.1109/TPEL.2019.2897636
File:
PDF, 5 KB
english, 2019