Comparative Study of Al Metallization Degradation in Power...

IEEE Transactions on Components Packaging and Manufacturing Technology 2018 / 12 Vol. 8; Iss. 12

Comparative Study of Al Metallization Degradation in Power Diodes Under Passive and Active Thermal Cycling

Brincker, Mads, Pedersen, Kristian Bonderup, Kristensen, Peter Kjar, Popok, Vladimir N.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
8
Language:
english
Journal:
IEEE Transactions on Components, Packaging and Manufacturing Technology
DOI:
10.1109/tcpmt.2018.2877845
Date:
December, 2018
File:
PDF, 4.30 MB
english, 2018
Conversion to is in progress
Conversion to is failed