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Structural insights of hierarchically engineered feldspars by confocal Raman microscopy
Fuertes de la Llave, V., del Campo, A., Fernández, J.F., Enríquez, E.Journal:
Journal of Raman Spectroscopy
DOI:
10.1002/jrs.5556
Date:
January, 2019
File:
PDF, 1.38 MB
2019