Single particle transient response and displacement damage...

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 2019 / 03 Vol. 920

Single particle transient response and displacement damage in CMOS image sensors induced by high energy neutrons at Back-n in CSNS facility

Wang, Zujun, Xue, Yuanyuan, Chen, Wei, Ning, Hao, Xu, Rui, Guo, Xiaoqiang, Sheng, Jiangkun, Yao, Zhibin, He, Baoping, Ma, Wuying, Dong, Guantao
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Volume:
920
Language:
english
Journal:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
DOI:
10.1016/j.nima.2018.12.033
Date:
March, 2019
File:
PDF, 1.89 MB
english, 2019
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