[IEEE 2018 IEEE International Conference on Electron...

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[IEEE 2018 IEEE International Conference on Electron Devices and Solid State Circuits (EDSSC) - Shenzhen (2018.6.6-2018.6.8)] 2018 IEEE International Conference on Electron Devices and Solid State Circuits (EDSSC) - The Effect of Frequency Dispersion to the RF Performance of Dual Source Tunneling FETs

Qianwei, Kuang, Yongcheng, Ning, Dayu, Zhang, Shan, Cong, Mingchao, Chang
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Year:
2018
Language:
english
DOI:
10.1109/EDSSC.2018.8487068
File:
PDF, 7 KB
english, 2018
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