Defect localisation and quantitative identification in...

Defect localisation and quantitative identification in multi-layer conductive structures based on projection pursuit algorithm

Huang, Pingjie, Ding, Tianyu, Luo, Qing, Hou, Dibo, Yu, Jie, Zhang, Guangxin
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Volume:
34
Language:
english
Journal:
Nondestructive Testing and Evaluation
DOI:
10.1080/10589759.2018.1550488
Date:
January, 2019
File:
PDF, 2.49 MB
english, 2019
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