Defect localisation and quantitative identification in multi-layer conductive structures based on projection pursuit algorithm
Huang, Pingjie, Ding, Tianyu, Luo, Qing, Hou, Dibo, Yu, Jie, Zhang, GuangxinVolume:
34
Language:
english
Journal:
Nondestructive Testing and Evaluation
DOI:
10.1080/10589759.2018.1550488
Date:
January, 2019
File:
PDF, 2.49 MB
english, 2019