Implications of X-ray beam profiles on qualitative and quantitative synchrotron micro-focus X-ray fluorescence microscopy
Morrell, Alexander P., Mosselmans, J. Frederick W., Geraki, Kalotina, Ignatyev, Konstantin, Castillo-Michel, Hiram, Monksfield, Peter, Warfield, Adrian T., Febbraio, Maria, Roberts, Helen M., Addison,Volume:
25
Language:
english
Journal:
Journal of Synchrotron Radiation
DOI:
10.1107/S160057751801247X
Date:
November, 2018
File:
PDF, 1.91 MB
english, 2018