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[IEEE IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society - D.C., DC, USA (2018.10.21-2018.10.23)] IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society - Single Switch Open-Circuit Fault Detection for Three-Level NPC Inverter Using Conducted Emissions Signature
Abari, Ibtissem, Hamouda, Mahmoud, Ben Hadj Slama, Jaleleddine, Al-Haddad, KamalYear:
2018
DOI:
10.1109/IECON.2018.8591826
File:
PDF, 8 KB
2018