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[IEEE 2018 International Semiconductor Conference (CAS) - Sinaia (2018.10.10-2018.10.12)] 2018 International Semiconductor Conference (CAS) - Permittivity Characterization Using a Double-Sided Parallel-Strip Line Resonator
Nesic, Dusan A., Radnovic, IvanaYear:
2018
DOI:
10.1109/SMICND.2018.8539801
File:
PDF, 7 KB
2018