A Random Interrupt Dithering SAR Technique for Secure ADC Against Reference-Charge Side-Channel Attack
Miki, Takuji, Miura, Noriyuki, Sonoda, Hiroki, Mizuta, Kento, Nagata, MakotoYear:
2019
Journal:
IEEE Transactions on Circuits and Systems II: Express Briefs
DOI:
10.1109/TCSII.2019.2901534
File:
PDF, 2.08 MB
2019