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[IEEE 2018 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Kyoto (2018.6.21-2018.6.22)] 2018 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Development of Highly-Sensitive Transient Photocapacitance Mesurement System for Deep Defects in Boron-Doped Diamond (100) Films
Miyawaki, Kenta, Yamashita, Ryosuke, Kodama, Taishi, Maida, OsamuYear:
2018
DOI:
10.1109/IMFEDK.2018.8581973
File:
PDF, 6 KB
2018