Optimal scale Gaussian process regression model in Insulated Gate Bipolar Transistor remaining life prediction
Li, Ling-Ling, Zhang, Xin-Bao, Tseng, Ming-Lang, Zhou, Ya-TongVolume:
78
Journal:
Applied Soft Computing
DOI:
10.1016/j.asoc.2019.02.035
Date:
May, 2019
File:
PDF, 1.50 MB
2019