Comprehensive analysis of field-electron emission...

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 2019 / 03 Vol. 37; Iss. 2

Comprehensive analysis of field-electron emission properties of nanosized silicon blade-type and needle-type field emitters

Demin, Gleb D., Djuzhev, Nikolay A., Filippov, Nikolay A., Glagolev, Petr Yu., Evsikov, Iliya D., Patyukov, Nikolay N.
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Volume:
37
Language:
english
Journal:
Journal of Vacuum Science & Technology B
DOI:
10.1116/1.5068688
Date:
March, 2019
File:
PDF, 1.61 MB
english, 2019
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