Analysis of Power Reduction Techniques used in Testing of VLSI Circuits
Jadeja, Shaktisinh Karnubha, Pate, RajendraVolume:
4
Year:
2015
Language:
english
Journal:
Journal of Electrical & Electronic Systems
DOI:
10.4172/2332-0796.1000148
File:
PDF, 557 KB
english, 2015