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AIP Conference Proceedings [Author(s) ADVANCES IN MATERIALS, MACHINERY, ELECTRONICS III: 3rd International Conference on Advances in Materials, Machinery, Electronics (AMME 2019) - Wuhan, China (19–20 January 2019)] - A fall detection method based on multi-threshold value and EML learning machine
Yang, Jia, Gao, Tongyue, Huang, KaidaVolume:
2073
Year:
2019
DOI:
10.1063/1.5090705
File:
PDF, 1.26 MB
2019