Atomic resolution in dynamic force microscopy across steps...

Zeitschrift für Physik B Condensed Matter 1996 / 03 Vol. 100; Iss. 2

Atomic resolution in dynamic force microscopy across steps on Si(1 1 1)7×7

R. Lüthi, E. Meyer, M. Bammerlin, A. Baratoff, T. Lehmann, L. Howald, C. Gerber, H.-J. Güntherodt
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Volume:
100
Language:
english
Pages:
3
DOI:
10.1007/s002570050106
Date:
March, 1996
File:
PDF, 282 KB
english, 1996
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