Anomalous output characteristics shrinkage in STI-LDMOS...

Superlattices and Microstructures 2019 / 04 Vol. 128

Anomalous output characteristics shrinkage in STI-LDMOS transistor after repetitive I-V scanning measurements

Ye, Ran, Liu, Siyang, Wu, Haibo, Chen, Hongting, Yang, Lanlan, Sun, Weifeng, Lu, Shengli, Wei, Jiaxing, Zhang, Long
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Volume:
128
Language:
english
Journal:
Superlattices and Microstructures
DOI:
10.1016/j.spmi.2019.01.027
Date:
April, 2019
File:
PDF, 1.29 MB
english, 2019
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