Defect-affected Photocurrent in MoTe2 FETs
Ghimire, Mohan Kumar, Ji, Hyunjin, Gul, Hamza Zad, Yi, Hojoon, Jiang, Jinbao, Lim, Seong ChuLanguage:
english
Journal:
ACS Applied Materials & Interfaces
DOI:
10.1021/acsami.9b00050
Date:
February, 2019
File:
PDF, 705 KB
english, 2019