Experimental validation of a large-signal MESFET model for submicron-gate-length devices
Stefano D'Agostino, Claudio PaoloniVolume:
15
Year:
1997
Language:
english
Pages:
3
DOI:
10.1002/(sici)1098-2760(199707)15:43.0.co;2-4
File:
PDF, 124 KB
english, 1997