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[IEEE 2018 IEEE Asian Solid-State Circuits Conference (A-SSCC) - Tainan (2018.11.5-2018.11.7)] 2018 IEEE Asian Solid-State Circuits Conference (A-SSCC) - A Fully Standard-Cell Based On-Chip BTI and HCI Monitor with 6.2x BTI sensitivity and 3.6x HCI sensitivity at 7 nm Fin-FET Process
Igarashi, Mitsuhiko, Uchida, Yuuki, Takazawa, Yoshio, Tsukamoto, Yasumasa, Shibutani, Koji, Nii, KojiYear:
2018
Language:
english
DOI:
10.1109/ASSCC.2018.8579303
File:
PDF, 6 KB
english, 2018