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[IEEE 2018 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Kyoto (2018.6.21-2018.6.22)] 2018 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - A Novel Design of P Implanted Regions for a Power MOSFET
Yeh, Wen-Bin, Su, Yi-Che, Lee, Kung-Yen, Cheng, Chia-Hui, Huang, Chih-FangYear:
2018
DOI:
10.1109/IMFEDK.2018.8581972
File:
PDF, 6 KB
2018