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[IEEE 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC) - Singapore (2018.5.14-2018.5.18)] 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC) - Effect of contact resistance on conformai shield package for mobile DRAM
Jin, Jungho, Jeon, Choongpyo, Min, Byounggug, Lim, Heonsang, Kim, JungkiYear:
2018
Language:
english
DOI:
10.1109/ISEMC.2018.8393794
File:
PDF, 7 KB
english, 2018