Investigation on the electrical performances and stability...

Materials Science in Semiconductor Processing 2019 / 06 Vol. 95

Investigation on the electrical performances and stability of W-doped ZnO thin-film transistors

Abliz, Ablat, Wan, Da, Yang, Linyu, Mamat, Mamatrishat, Chen, Henglei, Xu, Lei, Wang, Chunlan, Duan, Haiming
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Volume:
95
Language:
english
Journal:
Materials Science in Semiconductor Processing
DOI:
10.1016/j.mssp.2019.01.027
Date:
June, 2019
File:
PDF, 1.64 MB
english, 2019
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