[IEEE 2018 2nd International Conference on Trends in Electronics and Informatics (ICOEI) - Tirunelveli (2018.5.11-2018.5.12)] 2018 2nd International Conference on Trends in Electronics and Informatics (ICOEI) - Design and Development of an Automated and Integrated Test System for IEC-60870-5-104 Communication Protocol and Product Life Cycle Analysis

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