[IEEE 2018 19th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) - Erlagol (2018.6.29-2018.7.3)] 2018 19th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) - Testing Microcontroller Based Physical Systems Using Finite Transition Models
Laputenko, Andrey V., Petukhov, Timofey D., Vasnev, Nikolai A.Year:
2018
DOI:
10.1109/EDM.2018.8435029
File:
PDF, 7 KB
2018