[IEEE 2018 Non-Volatile Memory Technology Symposium (NVMTS)...

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[IEEE 2018 Non-Volatile Memory Technology Symposium (NVMTS) - Sendai (2018.10.22-2018.10.24)] 2018 Non-Volatile Memory Technology Symposium (NVMTS) - Improvement of Endurance and Data-retention in 40nm TaOX-based ReRAM by Finalize Verify

Fukuyama, Shouhei, Matsuda, Shinpei, Yasuhara, Ryutaro, Takeuchi, Ken
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Year:
2018
DOI:
10.1109/NVMTS.2018.8603105
File:
PDF, 7 KB
2018
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