![](/img/cover-not-exists.png)
X-Ray Stress Measurement of Silicon Single Crystal.
SUZUKI, Hiroshi, AKITA, Koichi, MISAWA, HiroshiVolume:
49
Year:
2000
Journal:
Journal of the Society of Materials Science, Japan
DOI:
10.2472/jsms.49.534
File:
PDF, 1.83 MB
2000