Probing Nanoscale Local Lattice Strains in Semiconductor Nanostructures and Devices by Transmission Electron Microscopy
Wang, Jinguo, Lian, Guoda, Kim, Moon J.Volume:
24
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927618005354
Date:
August, 2018
File:
PDF, 312 KB
english, 2018