Reliable Mobility Evaluation of Organic Field-Effect...

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IEEE Electron Device Letters 2019

Reliable Mobility Evaluation of Organic Field-Effect Transistors with Different Contact Metals

Huang, Fanming, Liu, Ao, Zhu, Huihui, Xu, Yong, Balestra, Francis, Ghibaudo, Gerard, Noh, Yong-Young, Chu, Junhao, Li, Wenwu
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Year:
2019
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2019.2901315
File:
PDF, 6 KB
2019
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