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Characterization and Deembedding of Negative Series Inductance in On-Wafer Measurements of Thin-Film All-Oxide Varactors
Walk, Dominik, Kienemund, Daniel, Zeinar, Lukas, Salg, Patrick, Radetinac, Aldin, Komissinskiy, Philipp, Alff, Lambert, Jakoby, Rolf, Maune, HolgerYear:
2019
Language:
english
Journal:
IEEE Microwave and Wireless Components Letters
DOI:
10.1109/LMWC.2019.2897901
File:
PDF, 6 KB
english, 2019