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[IEEE 2017 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC) - Atlanta, GA (2017.10.21-2017.10.28)] 2017 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC) - Determination of the Depletion Region Thickness in X/γ–Ray Detectors with a Schottky Contact
Sklyarchuk, Valery M., Gnatyuk, Volodymyr A., Aoki, ToruYear:
2017
Language:
english
DOI:
10.1109/NSSMIC.2017.8533082
File:
PDF, 7 KB
english, 2017