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Analysis of medium-range order based on simulated segmented ring detector STEM-images: amorphous Si

Hilke, S., Kirschbaum, J., Hieronymus-Schmidt, V., Radek, M., Bracht, H., Wilde, G., Peterlechner, M.
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Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2019.02.023
Date:
February, 2019
File:
PDF, 7.71 MB
english, 2019
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