![](/img/cover-not-exists.png)
[IEEE 2017 IEEE Conference on Visual Analytics Science and Technology (VAST) - Phoenix, AZ (2017.10.3-2017.10.6)] 2017 IEEE Conference on Visual Analytics Science and Technology (VAST) - ODIX: A Rapid Hypotheses Testing System for Origin-Destination Data IEEE VAST Challenge Award for Excellence in Spatio-temporal Graph Analytics
Buchmuller, Juri, Jentner, Wolfgang, Streeb, Dirk, Keim, Daniel A.Year:
2017
DOI:
10.1109/VAST.2017.8585686
File:
PDF, 6 KB
2017