[IEEE 2017 IEEE Conference on Visual Analytics Science and...

  • Main
  • [IEEE 2017 IEEE Conference on Visual...

[IEEE 2017 IEEE Conference on Visual Analytics Science and Technology (VAST) - Phoenix, AZ (2017.10.3-2017.10.6)] 2017 IEEE Conference on Visual Analytics Science and Technology (VAST) - ODIX: A Rapid Hypotheses Testing System for Origin-Destination Data IEEE VAST Challenge Award for Excellence in Spatio-temporal Graph Analytics

Buchmuller, Juri, Jentner, Wolfgang, Streeb, Dirk, Keim, Daniel A.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2017
DOI:
10.1109/VAST.2017.8585686
File:
PDF, 6 KB
2017
Conversion to is in progress
Conversion to is failed