![](/img/cover-not-exists.png)
Ultraprecision Diameter Measurement of Small Holes with Large Depth-To-Diameter Ratios Based on Spherical Scattering Electrical-Field Probing
Bian, Xingyuan, Cui, Junning, Lu, Yesheng, Tan, JiubinVolume:
9
Language:
english
Journal:
Applied Sciences
DOI:
10.3390/app9020242
Date:
January, 2019
File:
PDF, 8.35 MB
english, 2019